VLSI Test Principles and Architectures: Design for Testability
Product Description
VLSI Test Principles and Architectures: Design for Testability
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. <br><br>· Most up-to-date coverage of design for testability. <br>· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. <br>· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.<br>· Lecture slides and exercise solutions for all chapters are now available.<br>· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.
Technical Specifications
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