VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.<ul><li>Most up-to-date coverage of design for testability. </li><li>Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. </li><li>Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.</li></ul>