Books > Engineering & Transportation > Engineering > Electrical & Electronics > Electronics > Semiconductors
Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
Product ID: 69991682
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Product Description
Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
<STRONG>Introduction to Focused Ion Beams</STRONG> is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Technical Specifications
Country
USA
Brand
Springer
Manufacturer
Springer
Binding
Paperback
ItemPartNumber
193 black & white illustrations
ReleaseDate
2010-10-29T00:00:01Z
UnitCount
1
EANs
9781441935748
