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Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution

Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution

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Product Description

Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution

Technical Specifications

Country
USA
Brand
Cambridge University Press
Manufacturer
Cambridge University Press
Binding
Paperback
ItemPartNumber
Refer to Sapnet.
UnitCount
1
EANs
9780521019934

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